Editorial Board

Advisers:

ZHANG Guangyi (The 14th Research Institute of China Electronics Technology Group Corporation)

BEN De (The 14th Research Institute of China Electronics Technology Group Corporation)

JIN Yaqiu (Fudan Univeristy)

SU Donglin (Beihang University)

FENG Zhenghe (Tsinghua University)

FANG Dagang (Nanjing University of Science and Technology)

Chairmen:

MAO Junfa (Shenzhen University)

HU Mingchun (The 14th Research Institute of China Electronics Technology Group Corporation)

Vice-chairman:

JIN Lin (The 14th Research Institute of China Electronics Technology Group Corporation)

Chief Editor:

ZHOU Zhipeng (The 14th Research Institute of China Electronics Technology Group Corporation)

Deputy Chief Editors:

WANG Bingzhong (University of Electronic Science and Technology of China)

HONG Wei (Southeast University)

DU Zhengwei (Tsinghua University)

LIU Pukun (Peiking University)

LIU Falin (University of Science and Technology of China)

WU Wen (Nanjing University of Science and Technology)

Members:

WANG Wenqi (Shanghai University)

WANG Guangming (Air Force Engineering University)

WANG Kan (The 14th Research Institute of China Electronics Technology Group Corporation)

SHI Xiaowei (Xidian University)

FENG Yijun (Nanjing University)

FENG Enxin (Xi’an Jiaotong University)

FENG Jinjun (The 12th Research Institute of China Electronics Technology Group Corporation)

LV Xin (Beijing Institute of Technology)

LV Wenjun (Nanjing University of Posts and Telecommunications)

ZHU Guoqiang (Wuhan University)

ZHU Hongbo (Nanjing University of Posts and Telecommunications)

SUN Lingling (Hangzhou Dianzi University)

SUN Hongbing (The 14th Research Institute of China Electronics Technology Group Corporation)

NIAN Fushun (The 41th Research Institute of China Electronics Technology Group Corporation)

LIU Haiwen (Xi’an Jiaotong University)

LIU Peiguo (National University of Defense Technology)

YAN Wei (Microsystem Technology Co., Ltd, CASIC)

LI Long (Xidian University)

WU Qun (Harbin Institute of Technology)

WANG Haiyong (The 50th Research Institute of China Electronics Technology Group Corporation)

ZHANG Debin (The 14th Research Institute of China Electronics Technology Group Corporation)

CHEN Chang (University of Science and Technology of China)

CHEN Wenhua (Tsinghua University)

CHEN Jixin (Southeast University)

CHENG Tangsheng (The 55th Research Institute of China Electronics Technology Group Corporation)

CHEN Xibin (The 39th Research Institute of China Electronics Technology Group Corporation)

XIAO Liu (Aerospace Information Research Institute, Chinese Academy of Sciences)

YANG Guomin (Fudan University)

ZHENG Xin (The 14th Research Institute of China Electronics Technology Group Corporation)

LUO Guoqing (Hangzhou Dianzi University)

ZHOU Chaohui (The 50th Research Institute of China Electronics Technology Group Corporation)

JIN Mouping (The 38th Research Institute of China Electronics Technology Group Corporation)

ZHAO Yongjiu (Nanjing University of Aeronautics and Astronautics)

YUAN Naichang (National University of Defense Technology)

TANG Min (Shanghai Jiao Tong University)

HUANG Kama (Sichuan University)

GONG Shuxi (Xidian University)

ZHANG Xianmin (Zhejiang University)

ZHANG Xiuyin (South China University of Technology)

GE Lei (Shenzhen University)

XUE Zhenghui (Beijing Institute of Technology)

WEI Guanghui (Army Engineering University of PLA)

International Editorial Members:

WU Ke (University of Montreal)

CHEN Zhining (National University of Singapore)

CHEN Chihou (City University of Hong Kong)

LUK Kwaiman (City University of Hong Kong)

LI Keren (National Institute of Information and Communications Technology)

Young Editorial Members:

DING Xiao (University of Electronic Science and Technology of China)

YU Daqun (The 14th Research Institute of China Electronics Technology Group Corporation)

WANG Yan (Fudan University)

YE Zhihong (Chongqing University of Posts and Telecommunications)

FENG Lele (China University of Mining and Technology)

REN Xingang (Anhui University)

LIU Xiyao (Shenzhen University)

RUAN Wenzhou (The 14th Research Institute of China Electronics Technology Group Corporation)

DU Chaohai (Peiking University)

ZHANG Kuang (Harbin Institute of Technology)

LI Jianxing (Xi’an Jiaotong University)

LI Yue (Tsinghua University)

LI Meiling (Shanghai University)

WU Qi (Beihang University)

WU Yuming (Beijing Institute of Technology)

YU Chao (Southeast University)

YU Yingrui (Nanjing University of Science and Technology)

XIAO Ke (National University of Defense Technology)

PANG Jian (Shanghai Jiao Tong University)

ZHENG Yiyuan (The 55th Research Institute of China Electronics Technology Group Corporation)

QU Shiwei (University of Electronic Science and Technology of China)

ZHAO Wensheng (Hangzhou Dianzi University)

XU Jinxu (South China University of Technology)

HUANG Qiulin (Xidian University)

CHENG Yongzhi (Wuhan University of Science and Technology)

CHENG Guoxiao (Nanjing University of Science and Technology)

ZENG Xu (The 12th Research Institute of China Electronics Technology Group Corporation)

CAI Tong (Air Force Engineering University)